An in depth look at trace metallic impurity determination by ICP-OES

Overcoming Interferences in Optical ICP Analyses
Oral Presentation

Prepared by T. Kozikowski
Inorganic Ventures, 300 Technology Drive, Christiansburg, Virginia, 24073, United States


Contact Information: tkozikowski@inorganicventures.com; 540-585-3030


ABSTRACT

Many environmental labs rely on interference check solutions (ICS) to evaluate and correct for mass interferences when following EPA Method 6020A. A certified reference material (CRM) producer has unique challenges in sourcing and purifying starting materials for producing ICS standards that meet or exceed detection limit requirements. Although ICP-MS can be used for evaluating impurity levels in such solutions, the very interferences ICS standards are designed for can make ICP-OES a much more useful tool for impurity determination. ICP-OES has its own spectral interferences to consider when evaluating elemental impurities in high-matrix solutions. The focus will be on 6020ICS standards and navigating through complex optical emission spectra.