Rapid Sample Assessment and Assisted Method Development for ICPOES Analysis Using the Agilent IntelliQuant Tool

Metals Analysis and Remediation
Oral Presentation

Prepared by
Agilent Technologies, 2850 Centerville Rd, Wilmington, DE, 19808, United States


Contact Information: greg.gilleland@agilent.com; 408-598-9892


ABSTRACT

In ICPOES analysis, proper method development that takes into account the spectral interferences in a specific set of samples can be challenging, especially when the operator lacks experience. The discussion will focus on how IntelliQuant screening and the smart tools available on Agilent's 5800/5900 ICPOES can streamline wavelength selection, provide real-time insights on sample analysis and instrument performance. Detailed examples will be shown and IntelliQuant data shown